BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Microstructure 
 of Materials and Systems IMWS//ENGLISH
BEGIN:VEVENT
UID:6e71b3d4-4399-4c1e-82ef-80b591c09f44
DTSTAMP:20251210T014707Z
SUMMARY:Backside FIB/SEM analysis strategy to identify failure mode
DTSTART:20240214T130000Z
DTEND:20240214T134500Z
END:VEVENT
END:VCALENDAR