BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Microstructure 
 of Materials and Systems IMWS//ENGLISH
BEGIN:VEVENT
UID:d9324585-4ca1-465c-9ba5-ede4d599c6cf
DTSTAMP:20260811T154425Z
SUMMARY:Backside FIB/SEM analysis strategy to identify failure mode
DTSTART:20240214T130000Z
DTEND:20240214T134500Z
END:VEVENT
END:VCALENDAR