Fraunhofer Institute for Microstructure of Materials and Systems IMWS
X-ray diffractometer measurement cell for studying strain-induced crystallization.
Wide-angle X-ray diffraction (WAXD) is used to characterize the crystalline structure of semicrystalline polymers and polymer-based components. It is a key method for quality control of components, process optimization in polymer processing, and the determination of input parameters for simulations.
The WAXD services of Fraunhofer IMWS include the determination of:
- Degree of crystallinity
- Melting and crystallization temperatures
- Polymorphic states and phase transitions
- Crystal size
- Crystal orientation
- Strain-induced crystallization processes