Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Know-How
Error analysis of an overloaded coulometric hydrogen sensor
left: STEM bright field image of the TEM cross section of a YSZ
right: STEM/EDX element distribution with crack and Al2O3 grains
- Microstructural characterization of gas-sensitive layers and surfaces
- Investigation of degradation processes in gas sensors
- Analysis of the causes of failure of defective sensors
- Material characterization and degradation in H2 environment
- Degradation of catalysts
- Thermal mapping of sensor structures and components
- Fault diagnostics