Light microscopy

Fehleranalyse Mikrochips Fraunhofer IMWS
© Fraunhofer IMWS
With the aid of a light microscope, samples from microchips can be examined for visible defects. The analysis of defective chips is an important part of the daily work at Fraunhofer IMWS.

Light microscopy is an optical testing method used at Fraunhofer IMWS to examine materials and samples under visible light. It enables the observation of structures, surface features, and other properties of the sample. In light microscopy, light is passed through a lens or a system of lenses to illuminate the sample. The light is then magnified by another lens and projected onto a detector surface to produce a magnified image of the sample. There are different types of light microscopes, including the reflected light microscope and the transmitted light microscope.

The reflected light microscope illuminates the sample from above, while the transmitted light microscope passes light through the sample from below. Light microscopy can be used to examine various materials, including metals, ceramics, plastics, biological samples, and much more. It allows the examination of structural features, surface texture, defects, impurities, and other properties of the sample. It should be noted that light microscopy has its limitations and is not capable of resolving very small structures in the nanometer range. However, more advanced techniques such as electron microscopy are available for higher resolution and more detailed investigations.