Equipment development


Always one step ahead

With its clients, the IMWS works on developing new equipment for microstructure elucidation. In the interview, Prof. Dr. Matthias Petzold explains the advantages this provides.


CSP test device for detecting the PID effect

A simple, fast and flexible kind of quality control in photovoltaics - already at cell level.


LAYTEC presents the LID test device for PERC cells

Based on a CSP test method, a Berlin company and licensee develops the »LID Scope« device.


Together with 3D-Micromac AG, we at the Fraunhofer IMWS have developed the microPREP™ system for fast and precise provision of material samples. The video explains graphically the function and advantages of such a system.


Volker Naumann awarded the Materials Prize (“Werkstoff-Preis”) by Schott AG


CSP honored at the IQ Innovation Prize

The Recognition Prize was presented by Halle’s Mayor Egbert Geier for the development of a test device for the quality control of solar cells and modules.