Sandy Klengel

Profile

Sandy Klengel, Group Manager ”Assessment of Electronic Systems Integration“, Deputy Head of Business Unit ”Electronic Materials and Components“

Areas of research

 

Research into microstructure-property correlations in micro- and power electronic components used in system technology

Reliability analyses and characterization of electronic components at system level

Research on electrochemical corrosion and migration processes in components of packaging and interconnection technology as well as adapted test development

 

Academic/professional resume

Since 2019

Deputy Head of Business Unit ”Electronic Materials and Components“, Fraunhofer IMWS

Since 2014

Group Manager ”Assessment of Electronic Systems Integration“, Fraunhofer IMWS

2007 - 2014

Deputy Group Manager ”Diagnosis and evaluation of microsystems“, Fraunhofer IMWS

2004 - 2013

Research Associate, Fraunhofer IMWS

1998 - 2004

Studies of electrical engineering with specialization in precision and micro engineering at the Technical University of Dresden

 

Awards

2019

Outstanding Paper at European Microelecronics and Packaging Conference (EMPC) for research on the influence of copper wire material on corrosion-resistant packages and systems for high-temperature applications, in cooperation with Nippon Micrometal Corporation Japan

2019

Best Session Paper at Electronic Components Technology Conference (ECTC) for paper on the material characterization of advanced cement-based potting systems for efficient power electronics with increased power density, jointly with Bianca Böttge, Falk Naumann and Matthias Petzold

2018

Best Poster Award at International Conference on Integrated Power Electronics Systems (CIPS) for “Novel specimen design to test engineering plastics for power electronic applications”, jointly with Bianca Böttge

 

Publications

Selected papers in peer-reviewed journals

Influence of copper wire material to corrosion resistant packages and systems for high temperature applications

Klengel, S.; Klengel, R.; Schischka, J.; Stephan, T.; Petzold, M.; Eto, M.; Araki, N.; Yamada, T.

Institute of Electrical and Electronics Engineers -IEEE-; International Microelectronics and Packaging Society -IMAPS-: 22nd European Microelectronics and Packaging Conference & Exhibition, EMPC 2019. Technical papers: 16-19 September 2019, Pisa, Italy. Piscataway, NJ: IEEE, 2019. S. 123-129

 

Corrosion mechanism in metallization systems for printed circuit boards

Klengel, S.; Stephan, T.; Mühs-Portius, B.; Klengel, R.

TU Dresden, Institut für Aufbau- und Verbindungstechnik der Elektronik -IAVT-; Institute of Electrical and Electronics Engineers -IEEE-; International Microelectronics and Packaging Society -IMAPS-: 7th Electronic System-Integration Technology Conference, ESTC 2018. Proceedings: 18th to 21st Sept. 2018, Dresden, Germany. Piscataway, NJ: IEEE, 2018. S. 268-274

 

A new method for prediction of corrosion processes in metallization systems for substrates and electrical contacts

Klengel, S.; Stephan, T.; Spohn, U.

IEEE Components, Packaging, and Manufacturing Technology Society: ECTC 2017, the 67th Electronic Components and Technology Conference: 30 May-2 June 2017, Lake Buena Vista, Florida. Proceedings

Piscataway, NJ: IEEE, 2017. S.1165-1170

 

High resolution analyzes of resistance behavior in eWLB metal contacts

Klengel, S.; Krause, M.; Berthold, L.; Petzold, M.; Förster, J.; Pressel, K.; Meyer, T.

International Microelectronics and Packaging Society IMAPS: IMAPS 2011, 44th International Symposium on Microelectronics. Proceedings. Vol. 1: Long Beach, California, USA, 9 - 13 October 2011. Red Hook, NY: Curran, 2012. S.241-248